Amoled displays with multiple readout circuits

ABSTRACT

The OLED voltage of a selected pixel is extracted from the pixel produced when the pixel is programmed so that the pixel current is a function of the OLED voltage. One method for extracting the OLED voltage is to first program the pixel in a way that the current is not a function of OLED voltage, and then in a way that the current is a function of OLED voltage. During the latter stage, the programming voltage is changed so that the pixel current is the same as the pixel current when the pixel was programmed in a way that the current was not a function of OLED voltage. The difference in the two programming voltages is then used to extract the OLED voltage.

CROSS REFERENCE TO RELATED APPLICATIONS

This application claims the benefit of U.S. Provisional Application No.61/787,397, filed Mar. 15, 2013 which is hereby incorporated byreference herein in its entirety.

FIELD OF THE INVENTION

The present disclosure generally relates to circuits for use indisplays, particularly displays such as active matrix organic lightemitting diode displays having multiple readout circuits for monitoringthe values of selected parameters of the individual pixels in thedisplays.

BACKGROUND

Displays can be created from an array of light emitting devices eachcontrolled by individual circuits (i.e., pixel circuits) havingtransistors for selectively controlling the circuits to be programmedwith display information and to emit light according to the displayinformation. Thin film transistors (“TFTs”) fabricated on a substratecan be incorporated into such displays. TFTs tend to demonstratenon-uniform behavior across display panels and over time as the displaysage. Compensation techniques can be applied to such displays to achieveimage uniformity across the displays and to account for degradation inthe displays as the displays age.

Some schemes for providing compensation to displays to account forvariations across the display panel and over time utilize monitoringsystems to measure time dependent parameters associated with the aging(i.e., degradation) of the pixel circuits. The measured information canthen be used to inform subsequent programming of the pixel circuits soas to ensure that any measured degradation is accounted for byadjustments made to the programming. Such monitored pixel circuits mayrequire the use of additional transistors and/or lines to selectivelycouple the pixel circuits to the monitoring systems and provide forreading out information. The incorporation of additional transistorsand/or lines may undesirably decrease pixel-pitch (i.e., “pixeldensity”).

SUMMARY

In accordance with one embodiment, the OLED voltage of a selected pixelis extracted from the pixel produced when the pixel is programmed sothat the pixel current is a function of the OLED voltage. One method forextracting the OLED voltage is to first program the pixel in a way thatthe current is not a function of OLED voltage, and then in a way thatthe current is a function of OLED voltage. During the latter stage, theprogramming voltage is changed so that the pixel current is the same asthe pixel current when the pixel was programmed in a way that thecurrent was not a function of OLED voltage. The difference in the twoprogramming voltages is then used to extract the OLED voltage.

Another method for extracting the OLED voltage is to measure thedifference between the current of the pixel when it is programmed with afixed voltage in both methods (being affected by OLED voltage and notbeing affected by OLED voltage). This measured difference and thecurrent-voltage characteristics of the pixel are then used to extractthe OLED voltage.

A further method for extracting the shift in the OLED voltage is toprogram the pixel for a given current at time zero (before usage) in away that the pixel current is a function of OLED voltage, and save theprogramming voltage. To extract the OLED voltage shift after some usagetime, the pixel is programmed for the given current as was done at timezero. To get the same current as time zero, the programming voltageneeds to change. The difference in the two programming voltages is thenused to extract the shift in the OLED voltage. Here one needs to removethe effect of TFT aging from the second programming voltage first; thisis done by programming the pixel without OLED effect for a given currentat time zero and after usage. The difference in the programming voltagesin this case is the TFT aging, which is subtracted from the calculateddifference in the aforementioned case.

In one implementation, the current effective voltage V_(OLED) of alight-emitting device in a selected pixel is determined by supplying aprogramming voltage to the drive transistor in the selected pixel tosupply a first current to the light-emitting device (the first currentbeing independent of the effective voltage V_(OLED) of thelight-emitting device); measuring the first current; supplying a secondprogramming voltage to the drive transistor in the selected pixel tosupply a second current to the light-emitting device, the second currentbeing a function of the current effective voltage V_(OLED) of thelight-emitting device; measuring the second current and comparing thefirst and second current measurements; adjusting the second programmingvoltage to make the second current substantially the same as the firstcurrent; and extracting the value of the current effective voltageV_(OLED) of the light-emitting device from the difference between thefirst and second programming voltages.

In another implementation, the current effective voltage V_(OLED) of alight-emitting device in a selected pixel is determined by supplying afirst programming voltage to the drive transistor in the selected pixelto supply a first current to the light-emitting device in the selectedpixel (the first current being independent of the effective voltageV_(OLED) of the light-emitting device), measuring the first current,supplying a second programming voltage to the drive transistor in theselected pixel to supply a second current to the light-emitting devicein the selected pixel (the second current being a function of thecurrent effective voltage V_(OLED) of the light-emitting device),measuring the second current, and extracting the value of the currenteffective voltage V_(OLED) of the light-emitting device from thedifference between the first and second current measurements.

In a modified implementation, the current effective voltage V_(OLED) ofa light-emitting device in a selected pixel is determined by supplying afirst programming voltage to the drive transistor in the selected pixelto supply a predetermined current to the light-emitting device at afirst time (the first current being a function of the effective voltageV_(OLED) of the light-emitting device), supplying a second programmingvoltage to the drive transistor in the selected pixel to supply thepredetermined current to the light-emitting device at a second timefollowing substantial usage of the display, and extracting the value ofthe current effective voltage V_(OLED) of the light-emitting device fromthe difference between the first and second programming voltages.

In another modified implementation, the current effective voltageV_(OLED) of a light-emitting device in a selected pixel is determined bysupplying a predetermined programming voltage to the drive transistor inthe selected pixel to supply a first current to the light-emittingdevice (the first current being independent of the effective voltageV_(OLED) of the light-emitting device), measuring the first current,supplying the predetermined programming voltage to the drive transistorin the selected pixel to supply a second current to the light-emittingdevice (the second current being a function of the current effectivevoltage V_(OLED) of the light-emitting device), measuring the secondcurrent, and extracting the value of the current effective voltageV_(OLED) of the light-emitting device from the difference between thefirst and second currents and current-voltage characteristics of theselected pixel.

In a preferred implementation, a system is provided for controlling anarray of pixels in a display in which each pixel includes alight-emitting device. Each pixel includes a pixel circuit thatcomprises the light-emitting device, which emits light when suppliedwith a voltage V_(OLED); a drive transistor for driving current throughthe light-emitting device according to a driving voltage across thedrive transistor during an emission cycle, the drive transistor having agate, a source and a drain and characterized by a threshold voltage; anda storage capacitor coupled across the source and gate of the drivetransistor for providing the driving voltage to the drive transistor. Asupply voltage source is coupled to the drive transistor for supplyingcurrent to the light-emitting device via the drive transistor, thecurrent being controlled by the driving voltage. A monitor line iscoupled to a read transistor that controls the coupling of the monitorline to a first node that is common to the source side of the storagecapacitor, the source of the drive transistor, and the light-emittingdevice. A data line is coupled to a switching transistor that controlsthe coupling of the data line to a second node that is common to thegate side of the storage capacitor and the gate of the drive transistor.A controller coupled to the data and monitor lines and to the switchingand read transistors is adapted to:

(1) during a first cycle, turn on the switching and read transistorswhile delivering a voltage Vb to the monitor line and a voltage Vd1 tothe data line, to supply the first node with a voltage that isindependent of the voltage across the light-emitting device,

(2) during a second cycle, turn on the read transistor and turn off theswitching transistor while delivering a voltage Vref to the monitorline, and read a first sample of the drive current at the first node viathe read transistor and the monitor line,

(3) during a third cycle, turn off the read transistor and turn on theswitching transistor while delivering a voltage Vd2 to the data line, sothat the voltage at the second node is a function of V_(OLED), and

(4) during a fourth cycle, turn on said read transistor and turn offsaid switching transistor while delivering a voltage Vref to saidmonitor line, and read a second sample the drive current at said firstnode via said read transistor and said monitor line. The first andsecond samples of the drive current are compared and, if they aredifferent, the first through fourth cycles are repeated using anadjusted value of at least one of the voltages Vd1 and Vd2, until thefirst and second samples are substantially the same.

The foregoing and additional aspects and embodiments of the presentinvention will be apparent to those of ordinary skill in the art in viewof the detailed description of various embodiments and/or aspects, whichis made with reference to the drawings, a brief description of which isprovided next.

BRIEF DESCRIPTION OF THE DRAWINGS

The foregoing and other advantages of the invention will become apparentupon reading the following detailed description and upon reference tothe drawings.

FIG. 1 is a block diagram of an exemplary configuration of a system fordriving an OLED display while monitoring the degradation of theindividual pixels and providing compensation therefor.

FIG. 2A is a circuit diagram of an exemplary pixel circuitconfiguration.

FIG. 2B is a timing diagram of first exemplary operation cycles for thepixel shown in FIG. 2A.

FIG. 2C is a timing diagram of second exemplary operation cycles for thepixel shown in FIG. 2A.

FIG. 3 is a circuit diagram of another exemplary pixel circuitconfiguration.

FIG. 4 is a block diagram of a modified configuration of a system fordriving an OLED display using a shared readout circuit, while monitoringthe degradation of the individual pixels and providing compensationtherefor.

FIG. 5 is an example of measurements taken by two different readoutcircuits from adjacent groups of pixels in the same row.

While the invention is susceptible to various modifications andalternative forms, specific embodiments have been shown by way ofexample in the drawings and will be described in detail herein. Itshould be understood, however, that the invention is not intended to belimited to the particular forms disclosed. Rather, the invention is tocover all modifications, equivalents, and alternatives falling withinthe spirit and scope of the invention as defined by the appended claims.

DETAILED DESCRIPTION

FIG. 1 is a diagram of an exemplary display system 50. The displaysystem 50 includes an address driver 8, a data driver 4, a controller 2,a memory 6, a supply voltage 14, and a display panel 20. The displaypanel 20 includes an array of pixels 10 arranged in rows and columns.Each of the pixels 10 is individually programmable to emit light withindividually programmable luminance values. The controller 2 receivesdigital data indicative of information to be displayed on the displaypanel 20. The controller 2 sends signals 32 to the data driver 4 andscheduling signals 34 to the address driver 8 to drive the pixels 10 inthe display panel 20 to display the information indicated. The pluralityof pixels 10 associated with the display panel 20 thus comprise adisplay array (“display screen”) adapted to dynamically displayinformation according to the input digital data received by thecontroller 2. The display screen can display, for example, videoinformation from a stream of video data received by the controller 2.The supply voltage 14 can provide a constant power voltage or can be anadjustable voltage supply that is controlled by signals from thecontroller 2. The display system 50 can also incorporate features from acurrent source or sink (not shown) to provide biasing currents to thepixels 10 in the display panel 20 to thereby decrease programming timefor the pixels 10.

For illustrative purposes, the display system 50 in FIG. 1 isillustrated with only four pixels 10 in the display panel 20. It isunderstood that the display system 50 can be implemented with a displayscreen that includes an array of similar pixels, such as the pixels 10,and that the display screen is not limited to a particular number ofrows and columns of pixels. For example, the display system 50 can beimplemented with a display screen with a number of rows and columns ofpixels commonly available in displays for mobile devices, monitor-baseddevices, and/or projection-devices.

Each pixel 10 includes a driving circuit (“pixel circuit”) thatgenerally includes a driving transistor and a light emitting device.Hereinafter the pixel 10 may refer to the pixel circuit. The lightemitting device can optionally be an organic light emitting diode(OLED), but implementations of the present disclosure apply to pixelcircuits having other electroluminescence devices, includingcurrent-driven light emitting devices. The driving transistor in thepixel 10 can optionally be an n-type or p-type amorphous siliconthin-film transistor, but implementations of the present disclosure arenot limited to pixel circuits having a particular polarity of transistoror only to pixel circuits having thin-film transistors. The pixelcircuit can also include a storage capacitor for storing programminginformation and allowing the pixel circuit to drive the light emittingdevice after being addressed. Thus, the display panel 20 can be anactive matrix display array.

As illustrated in FIG. 1, the pixel 10 illustrated as the top-left pixelin the display panel 20 is coupled to a select line 24 i, a supply line26 i, a data line 22 j, and a monitor line 28 j. A read line may also beincluded for controlling connections to the monitor line. In oneimplementation, the supply voltage 14 can also provide a second supplyline to the pixel 10. For example, each pixel can be coupled to a firstsupply line 26 charged with Vdd and a second supply line 27 coupled withVss, and the pixel circuits 10 can be situated between the first andsecond supply lines to facilitate driving current between the two supplylines during an emission phase of the pixel circuit. The top-left pixel10 in the display panel 20 can correspond to a pixel in the displaypanel in a “ith” row and “jth” column of the display panel 20.Similarly, the top-right pixel 10 in the display panel 20 represents a“jth” row and “mth” column; the bottom-left pixel 10 represents an “nth”row and “jth” column; and the bottom-right pixel 10 represents an “nth”row and “mth” column. Each of the pixels 10 is coupled to appropriateselect lines (e.g., the select lines 24 i and 24 n), supply lines (e.g.,the supply lines 26 i and 26 n), data lines (e.g., the data lines 22 jand 22 m), and monitor lines (e.g., the monitor lines 28 j and 28 m). Itis noted that aspects of the present disclosure apply to pixels havingadditional connections, such as connections to additional select lines,and to pixels having fewer connections, such as pixels lacking aconnection to a monitoring line.

With reference to the top-left pixel 10 shown in the display panel 20,the select line 24 i is provided by the address driver 8, and can beutilized to enable, for example, a programming operation of the pixel 10by activating a switch or transistor to allow the data line 22 j toprogram the pixel 10. The data line 22 j conveys programming informationfrom the data driver 4 to the pixel 10. For example, the data line 22 jcan be utilized to apply a programming voltage or a programming currentto the pixel 10 in order to program the pixel 10 to emit a desiredamount of luminance. The programming voltage (or programming current)supplied by the data driver 4 via the data line 22 j is a voltage (orcurrent) appropriate to cause the pixel 10 to emit light with a desiredamount of luminance according to the digital data received by thecontroller 2. The programming voltage (or programming current) can beapplied to the pixel 10 during a programming operation of the pixel 10so as to charge a storage device within the pixel 10, such as a storagecapacitor, thereby enabling the pixel 10 to emit light with the desiredamount of luminance during an emission operation following theprogramming operation. For example, the storage device in the pixel 10can be charged during a programming operation to apply a voltage to oneor more of a gate or a source terminal of the driving transistor duringthe emission operation, thereby causing the driving transistor to conveythe driving current through the light emitting device according to thevoltage stored on the storage device.

Generally, in the pixel 10, the driving current that is conveyed throughthe light emitting device by the driving transistor during the emissionoperation of the pixel 10 is a current that is supplied by the firstsupply line 26 i and is drained to a second supply line 27 i. The firstsupply line 26 i and the second supply line 27 i are coupled to thesupply voltage 14. The first supply line 26 i can provide a positivesupply voltage (e.g., the voltage commonly referred to in circuit designas “Vdd”) and the second supply line 27 i can provide a negative supplyvoltage (e.g., the voltage commonly referred to in circuit design as“Vss”). Implementations of the present disclosure can be realized whereone or the other of the supply lines (e.g., the supply line 27 i) isfixed at a ground voltage or at another reference voltage.

The display system 50 also includes a monitoring system 12. Withreference again to the top left pixel 10 in the display panel 20, themonitor line 28 j connects the pixel 10 to the monitoring system 12. Themonitoring system 12 can be integrated with the data driver 4, or can bea separate stand-alone system. In particular, the monitoring system 12can optionally be implemented by monitoring the current and/or voltageof the data line 22 j during a monitoring operation of the pixel 10, andthe monitor line 28 j can be entirely omitted. Additionally, the displaysystem 50 can be implemented without the monitoring system 12 or themonitor line 28 j. The monitor line 28 j allows the monitoring system 12to measure a current or voltage associated with the pixel 10 and therebyextract information indicative of a degradation of the pixel 10. Forexample, the monitoring system 12 can extract, via the monitor line 28j, a current flowing through the driving transistor within the pixel 10and thereby determine, based on the measured current and based on thevoltages applied to the driving transistor during the measurement, athreshold voltage of the driving transistor or a shift thereof.

The monitoring system 12 can also extract an operating voltage of thelight emitting device (e.g., a voltage drop across the light emittingdevice while the light emitting device is operating to emit light). Themonitoring system 12 can then communicate signals 32 to the controller 2and/or the memory 6 to allow the display system 50 to store theextracted degradation information in the memory 6. During subsequentprogramming and/or emission operations of the pixel 10, the degradationinformation is retrieved from the memory 6 by the controller 2 viamemory signals 36, and the controller 2 then compensates for theextracted degradation information in subsequent programming and/oremission operations of the pixel 10. For example, once the degradationinformation is extracted, the programming information conveyed to thepixel 10 via the data line 22 j can be appropriately adjusted during asubsequent programming operation of the pixel 10 such that the pixel 10emits light with a desired amount of luminance that is independent ofthe degradation of the pixel 10. In an example, an increase in thethreshold voltage of the driving transistor within the pixel 10 can becompensated for by appropriately increasing the programming voltageapplied to the pixel 10.

FIG. 2A is a circuit diagram of an exemplary driving circuit for a pixel110. The driving circuit shown in FIG. 2A is utilized to calibrate,program and drive the pixel 110 and includes a drive transistor 112 forconveying a driving current through an organic light emitting diode(OLED) 114. The OLED 114 emits light according to the current passingthrough the OLED 114, and can be replaced by any current-driven lightemitting device. The OLED 114 has an inherent capacitance C_(OLED). Thepixel 110 can be utilized in the display panel 20 of the display system50 described in connection with FIG. 1.

The driving circuit for the pixel 110 also includes a storage capacitor116 and a switching transistor 118. The pixel 110 is coupled to a selectline SEL, a voltage supply line Vdd, a data line Vdata, and a monitorline MON. The driving transistor 112 draws a current from the voltagesupply line Vdd according to a gate-source voltage (Vgs) across the gateand source terminals of the drive transistor 112. For example, in asaturation mode of the drive transistor 112, the current passing throughthe drive transistor 112 can be given by Ids=β (Vgs−Vt)², where β is aparameter that depends on device characteristics of the drive transistor112, Ids is the current from the drain terminal to the source terminalof the drive transistor 112, and Vt is the threshold voltage of thedrive transistor 112.

In the pixel 110, the storage capacitor 116 is coupled across the gateand source terminals of the drive transistor 112. The storage capacitor116 has a first terminal, which is referred to for convenience as agate-side terminal, and a second terminal, which is referred to forconvenience as a source-side terminal. The gate-side terminal of thestorage capacitor 116 is electrically coupled to the gate terminal ofthe drive transistor 112. The source-side terminal 116 s of the storagecapacitor 116 is electrically coupled to the source terminal of thedrive transistor 112. Thus, the gate-source voltage Vgs of the drivetransistor 112 is also the voltage charged on the storage capacitor 116.As will be explained further below, the storage capacitor 116 canthereby maintain a driving voltage across the drive transistor 112during an emission phase of the pixel 110.

The drain terminal of the drive transistor 112 is connected to thevoltage supply line Vdd, and the source terminal of the drive transistor112 is connected to (1) the anode terminal of the OLED 114 and (2) amonitor line MON via a read transistor 119. A cathode terminal of theOLED 114 can be connected to ground or can optionally be connected to asecond voltage supply line, such as the supply line Vss shown in FIG. 1.Thus, the OLED 114 is connected in series with the current path of thedrive transistor 112. The OLED 114 emits light according to themagnitude of the current passing through the OLED 114, once a voltagedrop across the anode and cathode terminals of the OLED achieves anoperating voltage (V_(OLED)) of the OLED 114. That is, when thedifference between the voltage on the anode terminal and the voltage onthe cathode terminal is greater than the operating voltage V_(OLED), theOLED 114 turns on and emits light. When the anode-to-cathode voltage isless than V_(OLED), current does not pass through the OLED 114.

The switching transistor 118 is operated according to the select lineSEL (e.g., when the voltage on the select line SEL is at a high level,the switching transistor 118 is turned on, and when the voltage SEL isat a low level, the switching transistor is turned off). When turned on,the switching transistor 118 electrically couples node A (the gateterminal of the driving transistor 112 and the gate-side terminal of thestorage capacitor 116) to the data line Vdata.

The read transistor 119 is operated according to the read line RD (e.g.,when the voltage on the read line RD is at a high level, the readtransistor 119 is turned on, and when the voltage RD is at a low level,the read transistor 119 is turned off). When turned on, the readtransistor 119 electrically couples node B (the source terminal of thedriving transistor 112, the source-side terminal of the storagecapacitor 116, and the anode of the OLED 114) to the monitor line MON.

FIG. 2B is a timing diagram of exemplary operation cycles for the pixel110 shown in FIG. 2A. During a first cycle 150, both the SEL line andthe RD line are high, so the corresponding transistors 118 and 119 areturned on. The switching transistor 118 applies a voltage Vd1, which isat a level sufficient to turn on the drive transistor 112, from the dataline Vdata to node A. The read transistor 119 applies a monitor-linevoltage Vb, which is at a level that turns the OLED 114 off, from themonitor line MON to node B. As a result, the gate-source voltage Vgs isindependent of V_(OLED) (Vd1−Vb−Vds3, where Vds3 is the voltage dropacross the read transistor 119). The SEL and RD lines go low at the endof the cycle 150, turning off the transistors 118 and 119.

During the second cycle 154, the SEL line is low to turn off theswitching transistor 118, and the drive transistor 112 is turned on bythe charge on the capacitor 116 at node A. The voltage on the read lineRD goes high to turn on the read transistor 119 and thereby permit afirst sample of the drive transistor current to be taken via the monitorline MON, while the OLED 114 is off. The voltage on the monitor line MONis Vref, which may be at the same level as the voltage Vb in theprevious cycle.

During the third cycle 158, the voltage on the select line SEL is highto turn on the switching transistor 118, and the voltage on the readline RD is low to turn off the read transistor 119. Thus, the gate ofthe drive transistor 112 is charged to the voltage Vd2 of the data lineVdata, and the source of the drive transistor 112 is set to V_(OLED) bythe OLED 114. Consequently, the gate-source voltage Vgs of the drivetransistor 112 is a function of V_(OLED) (Vgs=Vd2−V_(OLED)).

During the fourth cycle 162, the voltage on the select line SEL is lowto turn off the switching transistor, and the drive transistor 112 isturned on by the charge on the capacitor 116 at node A. The voltage onthe read line RD is high to turn on the read transistor 119, and asecond sample of the current of the drive transistor 112 is taken viathe monitor line MON.

If the first and second samples of the drive current are not the same,the voltage Vd2 on the Vdata line is adjusted, the programming voltageVd2 is changed, and the sampling and adjustment operations are repeateduntil the second sample of the drive current is the same as the firstsample. When the two samples of the drive current are the same, the twogate-source voltages should also be the same, which means that:

V _(OLED) =Vd2−Vgs

=Vd2−(Vd1−Vb−Vds3)

=Vd2−Vd1+Vb+Vds3.

After some operation time (t), the change in V_(OLED) between time 0 andtime t is ΔV_(OLED)=V_(OLED)(t) V_(OLED)(0)=Vd2(t)−Vd2(0). Thus, thedifference between the two programming voltages Vd2(t) and Vd2(0) can beused to extract the OLED voltage.

FIG. 2C is a modified schematic timing diagram of another set ofexemplary operation cycles for the pixel 110 shown in FIG. 2A, fortaking only a single reading of the drive current and comparing thatvalue with a known reference value. For example, the reference value canbe the desired value of the drive current derived by the controller tocompensate for degradation of the drive transistor 112 as it ages. TheOLED voltage V_(OLED) can be extracted by measuring the differencebetween the pixel currents when the pixel is programmed with fixedvoltages in both methods (being affected by V_(OLED) and not beingaffected by V_(OLED)). This difference and the current-voltagecharacteristics of the pixel can then be used to extract V_(OLED).

During the first cycle 200 of the exemplary timing diagram in FIG. 2C,the select line SEL is high to turn on the switching transistor 118, andthe read line RD is low to turn off the read transistor 118. The dataline Vdata supplies a voltage Vd2 to node A via the switching transistor118. During the second cycle 201, SEL is low to turn off the switchingtransistor 118, and RD is high to turn on the read transistor 119. Themonitor line MON supplies a voltage Vref to the node B via the readtransistor 118, while a reading of the value of the drive current istaken via the read transistor 119 and the monitor line MON. This readvalue is compared with the known reference value of the drive currentand, if the read value and the reference value of the drive current aredifferent, the cycles 200 and 201 are repeated using an adjusted valueof the voltage Vd2. This process is repeated until the read value andthe reference value of the drive current are substantially the same, andthen the adjusted value of Vd2 can be used to determine V_(OLED).

FIG. 3 is a circuit diagram of two of the pixels 110 a and 110 b likethose shown in FIG. 2A but modified to share a common monitor line MON,while still permitting independent measurement of the driving currentand OLED voltage separately for each pixel. The two pixels 110 a and 110b are in the same row but in different columns, and the two columnsshare the same monitor line MON. Only the pixel selected for measurementis programmed with valid voltages, while the other pixel is programmedto turn off the drive transistor 12 during the measurement cycle. Thus,the drive transistor of one pixel will have no effect on the currentmeasurement in the other pixel.

FIG. 4 illustrates a drive system that utilizes a readout circuit (ROC)300 that is shared by multiple columns of pixels while still permittingthe measurement of the driving current and OLED voltage independentlyfor each of the individual pixels 10. Although only four columns areillustrated in FIG. 4, it will be understood that a typical displaycontains a much larger number of columns. Multiple readout circuits canbe utilized, with each readout circuit sharing multiple columns, so thatthe number of readout circuits is significantly less than the number ofcolumns. Only the pixel selected for measurement at any given time isprogrammed with valid voltages, while all the other pixels sharing thesame gate signals are programmed with voltages that cause the respectivedrive transistors to be off. Consequently, the drive transistors of theother pixels will have no effect on the current measurement being takenof the selected pixel. Also, when the driving current in the selectedpixel is used to measure the OLED voltage, the measurement of the OLEDvoltage is also independent of the drive transistors of the otherpixels.

When multiple readout circuits are used, multiple levels of calibrationcan be used to make the readout circuits identical. However, there areoften remaining non-uniformities among the readout circuits that measuremultiple columns, and these non-uniformities can cause steps in themeasured data across any given row. One example of such a step isillustrated in FIG. 5 where the measurements 1 a-1 j for columns 1-10are taken by a first readout circuit, and the measurements 2 a-2 j forcolumns 11-20 are taken by a second readout circuit. It can be seen thatthere is a significant step between the measurements 1 j and 2 a for theadjacent columns 10 and 11, which are taken by different readoutcircuits. To adjust this non-uniformity between the last of a firstgroup of measurements made in a selected row by the first readoutcircuit, and the first of an adjacent second group of measurements madein the same row by the second readout circuit, an edge adjustment can bemade by processing the measurements in a controller coupled to thereadout circuits and programmed to:

(1) determine a curve fit for the values of the parameter(s) measured bythe first readout circuit (e.g., values 1 a-1 j in FIG. 5),

(2) determine a first value 2 a′ of the parameter(s) of the first pixelin the second group from the curve fit for the values measured by thefirst readout circuit,

(3) determine a second value 2 a of the parameter(s) measured for thefirst pixel in the second group from the values measured by the secondreadout circuit,

(4) determine the difference (2 a′-2 a), or “delta value,” between thefirst and second values for the first pixel in the second group, and

(5) adjust the values of the remaining parameter(s) 2 b-2 j measured forthe second group of pixels by the second readout circuit, based on thedifference between the first and second values for the first pixel inthe second group.

This process is repeated for each pair of adjacent pixel groups measuredby different readout circuits in the same row.

The above adjustment technique can be executed on each rowindependently, or an average row may be created based on a selectednumber of rows. Then the delta values are calculated based on theaverage row, and all the rows are adjusted based on the delta values forthe average row.

Another technique is to design the panel in a way that the boundarycolumns between two readout circuits can be measured with both readoutcircuits. Then the pixel values in each readout circuit can be adjustedbased on the difference between the values measured for the boundarycolumns, by the two readout circuits.

If the variations are not too great, a general curve fitting (or lowpass filter) can be used to smooth the rows and then the pixels can beadjusted based on the difference between real rows and the createdcurve. This process can be executed for all rows based on an averagerow, or for each row independently as described above.

The readout circuits can be corrected externally by using a singlereference source (or calibrated sources) to adjust each ROC before themeasurement. The reference source can be an outside current source orone or more pixels calibrated externally. Another option is to measure afew sample pixels coupled to each readout circuit with a singlemeasurement readout circuit, and then adjust all the readout circuitsbased on the difference between the original measurement and themeasured values made by the single measurement readout circuit.

While particular embodiments and applications of the present inventionhave been illustrated and described, it is to be understood that theinvention is not limited to the precise construction and compositionsdisclosed herein and that various modifications, changes, and variationscan be apparent from the foregoing descriptions without departing fromthe spirit and scope of the invention as defined in the appended claims.

1-25. (canceled)
 26. A system for determining the current effectivevoltage V_(OLED) of a pixel in an array of pixels in a display in whicheach pixel includes a light-emitting device that emits light whensupplied with a voltage V_(OLED), the system comprising a controlleradapted to: determine the current effective voltage V_(OLED) of alight-emitting device in a selected pixel in an array of pixels in adisplay in which each pixel includes a drive transistor for supplyingcurrent to said light-emitting device; supply current to saidlight-emitting device via said drive transistor in said selected pixel,said current being a function of the current effective voltage V_(OLED)of said light-emitting device; measure said current, and extract thevalue of the current effective voltage V_(OLED) of said light-emittingdevice from said current measurement.
 27. A system for determining thecurrent effective voltage V_(OLED) of a pixel in an array of pixels in adisplay in which each pixel includes a light-emitting device that emitslight when supplied with a voltage V_(OLED), the system comprising: apixel circuit in each of said pixels, said circuit including: a drivetransistor for driving current through the light-emitting deviceaccording to a driving voltage across the drive transistor during anemission cycle; a storage capacitor coupled across the source and gateof said drive transistor for providing said driving voltage to saiddrive transistor; a monitor line coupled to a read transistor thatcontrols the coupling of said monitor line to a node that is common tothe source of said drive transistor and said light-emitting device; adata line coupled to a switching transistor that controls the couplingof said data line to the gate of said drive transistor; and a controllercoupled to said data and monitor lines and to said switching and readtransistors, and adapted to: turn on said switching and read transistorsof a selected pixel while supplying said first node of said selectedpixel with a voltage that is sufficient to turn on said light-emittingdevice of said selected pixel, the current supplied to saidlight-emitting device being a function of the voltage V_(OLED) of saiddevice; measure the current flowing through said drive transistor andsaid light-emitting device of the selected pixel; and extract from saidcurrent measurement the effective voltage V_(OLED).
 28. The system ofclaim 27 in which said first node of said selected pixel is suppliedwith a first voltage that is not sufficient to turn on saidlight-emitting device of said selected pixel so that the currentsupplied to said light-emitting device is not a function of the voltageV_(OLED) of said device, prior to supplying said first node of saidselected pixel with a second voltage that is sufficient to turn on saidlight-emitting device of the selected pixel so that the current suppliedto said light-emitting device is a function of the voltage V_(OLED) ofsaid device.
 29. The system of claim 28 in which said voltage V_(OLED)is determined from the difference between said first and secondvoltages.
 30. A method of determining the current effective voltageV_(OLED) of a pixel in an array of pixels in a display in which eachpixel includes a light-emitting device that emits light when suppliedwith a voltage V_(OLED), the method comprising: determining the currenteffective voltage V_(OLED) of a light-emitting device in a selectedpixel in an array of pixels in a display in which each pixel includes adrive transistor for supplying current to said light-emitting device;supplying current to said light-emitting device via said drivetransistor in said selected pixel, said current being a function of thecurrent effective voltage V_(OLED) of said light-emitting device;measuring said current; and extracting the value of the currenteffective voltage V_(OLED) of said light-emitting device from saidcurrent measurement.
 31. The method of claim 30 in which said selectedpixel is supplied with a first voltage that is not sufficient to turn onsaid light-emitting device of said selected pixel so that the currentsupplied to said light-emitting device is not a function of the voltageV_(OLED) of said device, and then supplying said selected pixel with asecond voltage that is sufficient to turn on said light-emitting deviceof the selected pixel so that the current supplied to saidlight-emitting device is a function of the voltage V_(OLED) of saiddevice.
 32. The method of claim 31 in which said voltage V_(OLED) isdetermined from the difference between said first and second voltages.